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Bc. Ján Bella

Master's thesis

Image Distortion Correction in Panorama Stitching in SEM

Image Distortion Correction in Panorama Stitching in SEM
Abstract:
Cieľom práce bolo zadefinovať model geometrického skreslenia, ktoré vzniká pri snímaní panoramatických obrazov v rastrovacích elektrónových mikroskopoch, určiť parametre tohto modelu pre dané sady obrazových dlaždíc s využitím znalosti obrazových prekryvov a aplikovať model pri zošívaní dlaždíc do panorám. V porovnaní s bežnými metódami korekcie skreslenia, takto získaný obraz veľkosťou a tvarom presnejšie …more
Abstract:
The aim of the thesis was to define a distortion model of the imaging process of Scanning Electron Microscope, estimate the parameters of the model given image tiles and knowledge of overlapping regions, and apply the model while stitching image tiles into a panorama. In comparison to standard distortion correction methods, the resultant panoramas should correspond more accurately to the scanned objects …more
 

Keywords

Scanning Electron Microscopy image registration panorama stitching distortion correction feature detection feature matching constrained non-linear optimization polynomial optimization simulated annealing
 
Language used: English
Date on which the thesis was submitted / produced: 26. 5. 2017
Identifier: https://is.muni.cz/th/ovvrb/

Thesis defence

  • Date of defence: 23. 6. 2017
  • Supervisor: doc. RNDr. Pavel Matula, Ph.D.
  • Reader: RNDr. Vladimír Ulman, Ph.D.

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